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Instrument >> Instrument for Solar Cell >> Spectroscopic Ellipsometer:PH-SE
                

 

       The spectroscopic ellipsometer is used for thin film and material characterization in R & D. The spectroscopic ellipsometer is designed to meet the requirements in modern research with special emphasis on speed and accuracy for an unmatched variety of applications.
 
Product's Feature:

Thin film thickness
Reflection
Transmission
Refractive index
Absorption
Material composition
Index gradient
More simple and efficient method of sample alignment
Experimental data and simulated data with 3D graphics
Powerful spectroscopic ellipsometry measurement and analysis software
 
Technique Specification:

Wavelength range :350-850nm, 250-1100nm, 190-1700nm: 0.002 ° ~ 0.02 °
Wavelength accuracy: 1nm
Measuring time: <8s (depending on measurement mode and roughness)
Sample size: 125x125mm 156x156mm, 200x200mm cells, other sizes
Accuracy: 0.02nm
Refraction rate: 0.0002, 100nmSiO2 on Si
Angle accuracy: 0.01
Thickness range 0.01 nm - 50,000 nm
Extinction ratio : 10-6
 

Typical Customer:
American,Europe and Asia and so on.

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