国产精品久久久久7777按摩,天天做天天爱天天综合网2021,曰欧一片内射VΑ在线影院,亚洲最大国产成人综合网站

                



       The multiple angle laser ellipsometer provides film thickness, refractive index and absorption index at the HeNe laser wavelength 632,8 nm with an extraordinary precision and accuracy. It can be utilized to characterize single films, multiple layer stacks and bulk materials. 

 
Applications:

■ Microelectronics

■ Photovoltaic

 
Product's Feature:

■ High stability and accuracy

■ Laser wavelength 632.8 nm

■ Goniometer with angles of incidence set in 5o steps 

■ Multiple angle measurements 

■ Large material database 

■ Fully integrated support of multiple angle measurements for more complex applications and absolute thickness 

■ Fast and comfortable measurement at a selectable, application specific single angle of incidence

 
Technique Specification:
■ Precision of ψ, Δ at 90° (transmission) position: δ(ψ)=0.002°, δ(Δ)=0.002° 

■ Long term stability: δ(ψ)=±0.1°, δ(Δ)=±0.1° 

■ Precision of film thickness: 0.01nm  for 100 nm SiO2 on Si 

■ Precision of refractive index: 0.0005  for 100 nm SiO2 on Si

 
Typical Customer: 

American,Europe and Asia and so on.