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Instrument >> Instrument for Wafer >> Wafer Roughness Detector:HS-SRT-301
                

 

Product Brief: 
       SRT-301 Saw Mark Tester is used to Measure  Line-mark depth of the wafer surface,it has the advantages such.
       As  easy  carried, Conveniently operated Liquid crystal display, energy conservation and so on, At the same time,it has the  built-in printer and rechargeable batteries , All design are up to the standards of JIS,DIN,ISO,ANSI.


Product Feature:
convenient-operation Touch screen
the built-in printer and rechargeable batteries
JIS/DIN/ISO/ANSI compat 36 Evaluation parameters and 3 Analysis of charts
the trip of probe is up to 50mm
With statistical processing functions
With SURFPAK-SJ software PC- connection
Auto sleep function can effectively save energy。
High resolution LCD shows Roughness
Cost-Effective
 
Technique  Specification:
 Test Range:350μm (-200μm to +150μm)

 Method of Detecting:Differential induction

 Detection force:4mN or 0.75mN(Low force measurement method)

 Display: LCD Display

 Data Output: RS-232C/SPC Data Output

 Power: AC adapter/ battery(can replace)

 charging period:15 hours

 the using time of Battery :can test 600 times at most

 size(WxDxh):307×165×94mm

 Weight:1.2kg

 Size of Driver(WxDxh):115 x 23 x 26mm

 Weight of Driver:0.2kg
 

Typical Customers:
The United States, Europe, Asia and domestic solar energy and semiconductor customers.

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