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Carbon and Oxygen Tester





Features:
Good for analysing carbon and oxygen elements in multi-crystalline silicon and mono-crystalline silicon.
High Stability:
Unique cube-corner Michelson interferometer features not only small size and compact structure but also higher stability and less sensitive to vibrations and thermal variations compared with conventional Michelson interferometer.
Outside IR source design with easy replacement provides higher thermal stability. Stable interference is obtained without the need of dynamic adjustment.
High intensity IR source adopts a reflex sphere to obtain even and stable IR radiation.
High Accuracy and Reliability:
The application of programmable gain amplifier, high accuracy A/D converter and embedded computer improves the accuracy and reliability of the whole system.
Fully sealed damp and dust-proof interferometer, adopting high performance, long lifetime sealing material and desiccator, ensures higher adaptability to the environment and increases accuracy and reliability in operation
High accuracy gold coated optics with less energy losses realize maximum energy efficiency and increase energy output.
Practical Analytical Software:
Compatible PC control with user friendly, rich function software enables easy, convenient and flexible operation. Spectrum collect, spectrum conversion, spectrum collect, spectrum conversion, spectrum processing, spectrum analyzing, and spectrum output function etc. can be performed
The spectrometer connects to PC via a USB port for automatic control and data communication, fully realizing plug-and-play and raising the software flexibility
An optional external beam allows access to the widest variety of high sensitive peripheral sampling system, such as GC/IR interface and FTIR microscope.
Various special IR libraries are available for routine search. Users can also add and maintain the libraries or set up new libraries by themselves
Accessory:
Special silicon plate holder
Automatic, fast and accurate measurement of oxygen and carbon in silicon crystal
Lower detection limit: 1.0×10-6cm-3 (at room temperature)
Silicon plate thickness:0.1-3.5nm
 




Specifications 

Spectral Range:  7800 to 400cm-1 
Resolution:   Better than 0.5cm-1   
Wavenumber Precision: ±0.01cm-1 
Scanning speed:   0.2-2.5 cm-1/s, automatically optimized for detector type or manually adjustable   for specific applications  
Signal to Noise Ratio:   Better than 15000:1 (RMS value, at 2100cm-1-  2000cm-1 or 2100cm-1-   2200cm-1, resolution: 4cm-1, detector: DTGS, 32times date collection) 
Beam Splitter: Ge coated KBr
Infrared Source: External, air-cooled, high efficiency Reflex Sphere module
Detector: DTGS(Deuterated Triglycine Sulfate Detector), MCT(Mercury Cadmium Telluride) (optional)
Date System: Compatible computer
Software: FT-IR software contains all routines needed for basic spectrometer of operations
IR Library: 11 IR libraries including
Dimensions: 63×52×24cm
Power: AC:220V/50HZ, 1000VA
Weight: 20kg




Customers:
Suntech,Solargiga,JASOLAR,ErMei739,HuanOu,Tianyuan and so on more than 100 customers.